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. 2023 Feb 21;16(5):1781. doi: 10.3390/ma16051781

Table 1.

The measured and corrected d33 of AlN and Al0.9Sc0.1N films from synchrotron XRD, PM300, HBAR and theoretical calculation.

Material Method Measured d33 (pC/N) Corrected d33 (pC/N) Theoretical
Calculated d33 (pC/N)
AlN Synchrotron XRD 3.54 4.76 5.38
PM300 6.33 4.29
HBAR 4.22 5.43
Al0.9Sc0.1N Synchrotron XRD 5.58 7.79 7.89
PM300 8.96 7.03
HBAR 6.04 8.25