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. 2023 Feb 28;15(5):1224. doi: 10.3390/polym15051224

Figure 2.

Figure 2

(a) FT-IR spectra and (b) wide-scan XPS spectra of SiO2 particles; high-resolution XPS spectra: (c,d) C1s peaks of f-SiO2 and SiO2, respectively; (e,f) Si2p peaks of f-SiO2 and SiO2, respectively.