Table 3.
Model Fit for LCSMs of Common Factors for Drift Rates of the Three CRTs
| Masking time | Model Fit |
Comparison with configural model | |||
|---|---|---|---|---|---|
| χ2[df] | CFI | RMSEA | SRMR | Δχ2 [df] | |
|
| |||||
| 12 ms | 4.26 [7] | 1.00 | .00 | .06 | 3.73 [4] |
| 24 ms | 16.30 [7] | .96 | .12 | .09 | 9.23 [4] |
| 47 ms | 21.20 [7] | .94 | .14 | .08 | 17.33 [4]* |
| 94 ms | 10.28 [7] | .98 | .08 | .05 | 8.12 [4] |
| alla | 22.25 [7] | .94 | .15 | .09 | 16.22 [4] |
Note. Strong measurement invariance; correlated residuals for same tasks at pretest and posttest, as well as for the Letters and Digits task at pretest and at posttest.
Drift rate estimates for the different masking time conditions averaged before analysis.
p < .05.