Skip to main content
. 2023 Mar 27;14:1711. doi: 10.1038/s41467-023-37404-0

Fig. 2. Electronic Characterization and Analysis.

Fig. 2

a High-resolution Pt 4f XPS spectra of PtC60 and Pt NCs. b, c All-in-vacuum XPS and UPS spectra of Pt/C60 film within the same vacuum chamber. d Binding energy of Pt 4f7/2 and work function depending on the amount of Pt deposited on C60 film corresponding to (b and c). e Normalized XANES spectra at Pt L3-edge of PtC60, Pt NCs, Pt foil, and PtO2. f EXAFS spectra of PtC60, Pt NCs, Pt foil and PtO2. g Average oxidation states, and d-band hole counts fitted via XANES spectra in (e). h, i Wavelet transform for the k3-weighted EXAFS spectra for PtC60 and Pt NCs, respectively.