Skip to main content
. 2023 Mar 10;23(6):3016. doi: 10.3390/s23063016

Figure 14.

Figure 14

EL images of 3 pc-Si ODT modules that operated for (ad) 5 years, (e,f), 4 years, and (g,h) 2 years and experienced different degradation effects. The bias V and the allowed I are shown for each case.