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. 2023 Mar 9;56(Pt 2):439–448. doi: 10.1107/S1600576723001486

Table 1. Lengths and average radii of NWs estimated from scanning electron microscopy (SEM) (Calabrese et al., 2020) and the results of the present XRD and GISAXS study.

The XRD measurements of FWHMs of the tilt and twist distributions were performed for the 0002 and Inline graphic reflections, respectively. In the Monte Carlo simulation of GISAXS intensity, the FWHMs of the tilt were obtained from the q z scans in Fig. 5, while the roughness of the side facets, the NW radius and the fraction Inline graphic of the { Inline graphic } facets were obtained from the modelling of the I(q x ) intensity curves in Fig. 6. The mean values and standard deviations of the distributions for the radius and facet ratios are given.

          GISAXS (Monte Carlo)
  SEM XRD     Radius Inline graphic
Sample Length (µm) Radius (nm) Tilt (°) Twist (°) Tilt (°) Roughness r.m.s. (nm) Mean (nm) Width (nm) Mean Width
A 1.6 22 1.86 0.73 2.3 2.3 20.7 8.6 0.4 0.09
B 1.0 15 1.78 0.99 1.7 0.7 11.2 5.2 0  
C 0.7 22 1.52 0.89 1.7 1.3 17.4 8.6 0.33 0.14
D 1.2 29 1.52 0.82 2.0 0.9 24.4 10.3 0.37 0.14