Figure 4.

3D reconstruction of an amorphous Ta film at atomic resolution. (a–b), 3D atomic model of the amorphous Ta thin film at two different orientations, reconstructed by RESIRE. (c–f), 1.61-Å-thick central slices of the amorphous thin film in the XY plane, reconstructed by FBP, SIRT, GENFIRE and RESIRE, respectively. (g–j), 1.61-Å-thick central slices in the YZ plane of the reconstructions, where the missing wedge direction is along the z-axis. (k–n), magnified regions in (g–j) (red squares), showing that RESIRE produces a high quality reconstruction with least artifacts. (o–r), 1.61-Å-thick central slices in the XZ plane of the reconstructions. (s–v), magnified regions in (o–r) (yellow squares). Compared with the other methods, RESIRE shows less peripheral noise, more easily detectable atomic features and reduces missing wedge effects.