Table 2.
Characteristic | Thin Films | SPD-Processed Bulk Materials |
---|---|---|
Purity | High purity (vacuum environment, clean surfaces) [82] | Presence of impurities [74,86,87] |
Achievable Grain Size | <10 nm [82] | HPT: 10–100 nm [76] Mechanical milling: 5–50 nm [84,85] Other SPD processes: <1 μm [76,86] |
Grain Structure | Primarily columnar grains [82,83] Lattice strain from rapid cooling [82] |
Equiaxed grains [86] High-angle grain boundaries [86,87] |
Grain Structure Control | Grain size can be controlled via substrate temperature [82,83] | Grain boundary misorientation evolves with strain [74] Flash annealing to control grain size |
Scalability | Limited by vacuum/clean environment | HPT: size limited (samples typically 10 mm in diameter and 1 mm thick) [76] Other processes: scalable |
Limitation | Specimen thickness effect [64] | Difficult to control grain boundary character Impurity level (mechanical milling) |