Figure 2.
Degree of oxidation and defectiveness of GOs. Comparison of both mass and atomic O/C ratios from XPS and EA (a). Correlation between C sp2 (XPS), ID/IG (Raman), and Td (TGA) (b). C sp2 consumption related to C sp3 and epoxy functionalities (> O/C-O) (c). Relative amounts of > O/C-O, C=O, OC=O, and C–OH. Correlation between ID/IG, degree of oxidation (O/C, EA), and amount of C sp3 (XPS) (e). Total residue percentage together with Ca, Mg, K, Fe, Na, Mn, Ba, Se, Ca, Cu, V, Zn, Pt, Cr, and Al trace element abundance (ICP-OES) (f). Correlation between interlayer spacing (XRD) and O/C ratio (EA) for all the samples, and their comparison with other carbonaceous materials (g).