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. 2023 Apr 6;8(15):13492–13508. doi: 10.1021/acsomega.3c00110

Table 2. Determining Parameters and Characterizing Methods Used for Nanoparticle Characterizations.

property characterized approaches used for characterization
size (structural properties) EPLS, TRPS, NMR, MALDI, UV–vis, ICP-MS, DCS, EXAFS, AFM, DLS, XRD, SEM, TEM, HRTEM, and magnetic susceptibility
size distribution FMR, ICP-MS, NTA, SAXS, DLS, DCS, TRPS, DTA, SEM, and superparamagnetic relaxometry
shape 3D-tomography, FMR, EPLS, AFM, TEM, and HRTEM
crystal structure EXAFS, XRD, electron diffraction, STEM, and HRTEM
chemical state and oxidation state XPS, EELS, XAS, and Mössbauer spectroscopy
elemental and chemical composition MFM, SEM-EDX, ICP-OES, NMR, ICP-MS, LEIS, XRD, and XPS
surface charge EPM and zeta-potential
surface area and specific surface area liquid NMR and BET
growth kinetics liquid-TEM, cryo-TEM, TEM, NMR, and SAXS
concentration DCS, PTA, RMM-MEMS, UV–vis, and ICP-MS
agglomeration state TEM, cryo-TEM, SEM, UV–vis, DCS, zeta-potential, and DLS
density RMM-MEMS and DCS
single particle properties liquid TEM, HRTEM, MFM, and Sp-ICP-MS
3D visualization SEM, AFM, and 3D-tomography
NPs distribution in matrices/supports AFM, TEM, and SEM
abnormalities in the structure BSD and HRTEME
NPs detection EBSD, SEM, STEM, TEM, and magnetic-susceptibility
optical properties EELS-STEM and UV–vis-NIR
magnetic properties XMCD, FMR, MFM, Mössbauer spectroscopy, VSM, and SQUID