Fig. 4. WM multipattern n-back task (task 3).

(A) Experimental schematic of task 3 n-back variation for seven unique 3 × 3 patterns. Pattern A is always selected as the target; however, its location is semirandomly varied, to change n. The order of the interference patterns (B to G) is random. (B) Same as Fig. 3C but for three voltage sources (green) corresponding to target pattern (A shown) and seven output electrodes (one target drain, red). (C) Mean recall accuracy in experiment (navy) and simulation (orange), with and without reinforcement, for varying n (sorted by n). Shaded regions represent SEM. Chance accuracy (teal) represents a one-in-seven chance of correctly classifying the target pattern over the six alternative patterns. (D) Mean accuracy sorted by epoch and corresponding θ threshold values; N is the number of trials.