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. 2023 Apr 26;9(17):eadh1386. doi: 10.1126/sciadv.adh1386

Fig. 1. In situ GIWAXS and GISAXS profiles of SSC-PFSA with the fitting results.

Fig. 1.

(A) In situ GIWAXS profiles for the SSC-PFSA film formation process. (B) Diffraction peaks of critical structure formations. Evolution processes of (C) ionic phase diffraction peak (~0.2 Å−1) and (D) chain-ordering peak (1.2 Å−1). In situ GISAXS profiles of SSC-PFSA film in (E) in-plane (IP) and (F) out-of-plane (OOP) directions. Guinier-Porod fitting plots of GISAXS profiles in (G) IP and (H) OOP directions. a.u., arbitrary units.