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. 2023 Mar 8;616(7958):707–711. doi: 10.1038/s41586-023-05773-7

Extended Data Table 1.

Process output targets

graphic file with name 41586_2023_5773_Tab1_ESM.jpg

This table shows the output metrics that meet target and the values used in the calculation of the Progress Tracker. All units in nm except etch rate in units of nm min−1. CD, critical dimension; ΔCD, difference between the top and bottom CD of the feature.