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. 2023 Apr 4;23(8):3152–3158. doi: 10.1021/acs.nanolett.2c04696

Figure 1.

Figure 1

Scannable dual-focus metalens design. (a) Schematic of a scannable dual-focus metalens using a hybrid phase profile with an incident angle θ. (b) Crystalline silicon nanopillars with a height of H = 503 nm are arranged on a subwavelength square lattice with a periodicity of U = 200 nm in an aqueous environment. The transmittance and phase delay imparted by the nanopillar are retrieved using rigorous coupled-wave analysis. (c) Scanning electron micrographs of the fabricated metalens with a diameter of 160 μm.