Table 2. Summary of Experimental Conditions for ORR Studies with SEPMs.
SEPM | mode | substrate for ORR | tip | tip reaction | ref |
---|---|---|---|---|---|
SECM | FB | Pt | Au disk UME (Ø, 25 μm) | OER | (402) |
SECM | TG-SC | Pt, Ru, and Au | Pt disk UME (Ø, 25 μm) | H2O oxidation | (99) |
SECM | TG-SC | binary and tertiary combinations of Pd, Au, Ag, and Co (or Cu) on GC | W or Au disk UME (Ø, 25 μm) | H2O oxidation | (400) |
SECM | SG-TC | Au, Pt, and PdCo alloy-modified GC | Pt disk UME (Ø, 25 μm) | H2O oxidation | (399) |
SECM | SG-TC | Hg on Au | Pt or Au disk UME (Ø, 25 or 50 μm) | H2O2 oxidation | (404) |
SECM | SG-TC | Hg, Au, Ag, Cu, Pt, Pd, Pd80Co20, and Au60Cu40 | Pt disk UME (Ø, 25 μm) | H2O2 oxidation | (403) |
SECM | SG-TC | Pt and Pd nano/microstructure | Pt disk UME (Ø, 25 μm) | H2O2 oxidation | (406) |
SECM | SG-TC | Fe porphyrins on GC | Au disk UME (Ø, 25 μm) | FeIII(OO2–) oxidation | (407)a |
SECM | SG-TC | nanoporous Au and flat Au substrates | Pt disk UME (Ø, 25 μm) | H2O2 oxidation | (408) |
SECM | TG-SC-TC | Au microdisk | microring-disk (ring Au thickness 750 nm, disk Pt Ø, 1 μm) | HO2– oxidation | (100) |
SECM | RC | Pt spots on GC | Pt disk UME (Ø, 10 μm) | ORR | (106) |
SECM | RC | Pt–Ag NPs (varying Ag content) | Pt disk UME (Ø, 25 μm) | ORR | (411) |
SECM | RC | patterned CNTs decorated with Pt NPs | Pt disk UME (Ø, 25 μm) | ORR, H2O oxidation | (412) |
SECM | RC | undoped and N-doped CNTs | Pt disk UME (Ø, 25 μm) | ORR | (413) |
SECM | RC | Pt, Au, Ru, and Rh and their co-deposits | Pt disk UME (Ø, 25 or 50 μm) | ORR, H2O oxidation | (432) |
SECM | RC | CoS2 | Pt disk UME (Ø, 10 μm) | ORR | (414)a |
SECM | RC | La0.6M0.4Ni0.6Cu0.4O3 (M = Ag, Ba, Ce) | Pt disk UME (Ø, 10 μm) | ORR | (415)a |
SECM | RC | tetratolyl porphyrins (containing Mn, Fe, and Co as central metals) | Pt disk UME (Ø, 25 μm) | ORR | (108) |
SECM | RC, SG-TC | Pd–Pt and Pd–Au electrodeposits on graphite | Pt disk UME (Ø, 25 μm) | H2O2 oxidation | (417) |
SECM | TG-SC, SG-TC, RC | Pt and Au on GC | Pt disk UME | ORR | (115) |
SECM | RC, SG-TC | CoxOy/NC and NixOy/NC | Pt disk UME (Ø, 25 μm) | H2O2 oxidation | (433) |
SECM | RC | Ni0.9Co0.1Fe2O4 mixed oxide | Pt disk UME (Ø, 25 μm) | ORR | (418) |
SECM | RC | MWCNTs, CoP, and MWCNTs/CoP | Pt disk UME (Ø, 25 μm) | ORR | (419) |
SECM | TG-RC | FeN4/rGO | Pt disk UME (Ø, 10 μm) | ORR | (420) |
SECM | RC (4D-SF/SECM) | GDEs | Pt disk UME (Ø, ∼1.8 μm) | ORR | (421) |
SECM | 4D-SF/SECM | GDEs | Pt disk UME (Ø, ∼1 μm) | PtO reduction | (422)a |
SECM/SICM | SG-TC, hopping | Au NPs | Theta pipette filled with (aperture Ø, ∼200 nm) | H2O2 oxidation | (425) |
AFM/SECM | noncontact | HOPG and isolated Pt particles | Au-coated SiO2 Pt (edge size 100 nm) | H2O2 oxidation | (423)a |
EC-STM | noncontact | cobalt(II) and copper(II) phthalocyanines | W coated with nail polish | ORR tunneling current | (429) |
EC-STM | constant current | iron octaethyiporphyrin, | W coated with nail polish | ORR tunneling current | (430) |
EC-STM | noncontact | iron phthalocyanine | W coated with nail polish | ORR tunneling current | (287) |
EC-STM | CoTPP on Au | W coated with nail polish | ORR tunneling current | (426) | |
n-EC-STM | constant current | Pt on Au | W coated with nail polish | ORR noise | (427) |
n-EC-STM | noncontact | Pt5Gd and Pt5Pr | ripped Pt/Ir alloy wire insulated with Apiezon | ORR noise | (52)a |
n-EC-STM | noncontact | Pt(111)-based surfaces | ripped Pt/Ir alloy wire insulated with Apiezon | ORR noise | (431)a |
n-EC-STM | noncontact | Pt(111) | Pt/Ir alloy wire insulated with Apiezon | ORR noise | (428)a |
Works published in the last 5 years.