Figure 3.

Raman characterization of the patterned 2D materials on glass coverslips. (a–c) Optical microscope images of patterned PtSe₂, MoS₂, and graphene samples. Raman scans were performed on pristine, patterned, and cleared regions for each material. Scale bars, 10 μm. (d–f) Averaged Raman spectra of pristine (red), patterned (green), and cleared (blue) regions of PtSe₂, MoS₂, and graphene. The spectra of the patterned areas show the expected modes with reduced intensity due to the material ablation. The mode characteristics of each material show no significant degradation of material quality for the patterned regions. The area where the 2D material was fully removed only shows weak or no corresponding Raman signal (blue line). In (d), (e), and (f), the spectra with low intensity are presented with different scaling factors for better visibility: 8× for patterned PtSe₂, 80× for areas cleared from PtSe₂, 2× for patterned MoS₂, 100× for areas cleared from MoS₂, and 50× for areas cleared from graphene.