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. 2023 Apr 22;16(9):3299. doi: 10.3390/ma16093299

Figure 22.

Figure 22

A TEM image of the structural components of the transitional layer of the base+2.5%Mo-1.5%Re-1.5%Ta-0.2%Ti sample: (a) distribution of the structural components in the lamella; (b) the zoomed-in area of the AlN phase; (c) an electron diffraction pattern recorded for the AlN grain along the [010] zone axis; and (d) an electron diffraction pattern recorded for the TiN grain along the [110] axis zone.