Figure 5.

(a) SEM images of perovskite films with different precursor solvents: (i) DMF/DMSO and (ii) NFM/DMSO. Reproduced with permission [73]. Copyright 2022, American Chemical Society. (b) PbI₂@MAFa and PbI₂@DMF/DMSO solution image and solution interaction diagram. (c) The J-V characteristic curves of pure electronic devices based on FAPbI₃@DMF/DMSO perovskite film (prepared in an N₂-filled glove box) and FAPbI₃@MAFa perovskite film (prepared at 70–90% humidity). Reproduced with permission [74]. Copyright 2021, American Association for the Advancement of Science. The ToF-SIMS depth profiles of perovskite films on FTO/NiO/BMIMBF₄ substrates are measured with (d) negative and (e) positive polarity. Reproduced with permission [75]. Copyright 2019, Springer Nature. (f) Control and (g) 2D GIWAXS images of BAAc-treated perovskite films, where the diffraction rings at about 11 nm⁻¹ and 16 nm⁻¹ are marked with black arrows. Reproduced with permission [76]. Copyright 2022, Wiley-VCH. (h) Dark J-V curves of pure hole devices with different contents of PAB-modified perovskite layers [77]. Copyright 2022, Elsevier. (i) Energy level diagram of PSCs modified by different fullerene derivative materials. Reproduced with permission [78]. Copyright 2020, Elsevier. (j) FTIR spectra of PbI₂ interacting with PC₆₁B-TEG. Reproduced with permission [79]. Copyright 2022, Wiley-VCH.