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. 2023 Apr 24;15(9):2010. doi: 10.3390/polym15092010

Figure 7.

Figure 7

(a) X-ray diffraction (XRD) patterns of TiO2 and Li: TiO2 samples. Reproduced with permission [105]. Copyright 2023, Elsevier. (b) J-V curves of Cs0.1FA0.9PbI3 devices based on furnace-treated and optimized laser-processed Ta-TiO2 films. Reproduced with permission [106]. Copyright 2022, American Chemical Society. (c) The surface defect sites of SnO2 and the schematic diagram of ChCl-SnO2 nanoparticle solution. Reproduced with permission [107]. Copyright 2022, Wiley-VCH. (d) Energy level diagram of PSCs before and after NH4F modification. Reproduced with permission [108]. Copyright 2022, American Chemical Society. (e) PSCs device structure diagram and DMAPAI2 embedded interface diagram. Reproduced with permission [109]. Copyright 2022, Elsevier. (f) Basic integral intensity corresponding to GIWAXS data of RbCl modified film upper surface and buried surface. (g) A schematic diagram of RbX crystallized on the surface of SnO2 and Rb-based perovskite formed on the buried interface of perovskite film. Reproduced with permission [110]. Copyright 2022, American Chemical Society. (h) IEP measurements of ZnO and Mn:ZnO powders. (i) SCLC measurements for ZnO and Mn:ZnO-based electron-only devices. Reproduced with permission [111]. Copyright 2022, American Chemical Society.