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. 2023 May 4;23(9):4478. doi: 10.3390/s23094478

Table 4.

Performance summary of the test chip.

Process 0.18 μm 1P5M CMOS with MIM
Supply voltage 2.6 V to 3.0 V
Column pitch 6.02 μm
# Columns 160
HCG LCG
Measurement noise 130.6 μVrms 452.9 μVrms
Input window 0.15 V 1.19 V
Power consumption (sim) 23 μW @2.8 V