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. 2023 May 11;13(10):1610. doi: 10.3390/nano13101610

Figure 1.

Figure 1

Field-emission electron microscopy (FE-SEM) images at high and low magnifications of (a,b) ZIF8-1 (150 min), (c,d) ZIF8-2 (120 min), and (e,f) ZIF8-3 (90 min).