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. 2023 Jun 5;138(6):495. doi: 10.1140/epjp/s13360-023-04018-w

Table 2.

Description of the available spectroscopy, diffraction and scattering, and imaging techniques for each beamline. Also indicated is the principal detection from each beamline, whereas visible light (vis), photoelectron (e-), or X-rays. The last column provides a link to a beamline article, if available

Beamline Techniques Detection Ref.
R1–1.5 GeV storage ring
FinEstBeAMS XPS, PLS1, UV-VUV spectro. (PEPICO2, TOFMS3) e-, vis [55]
Bloch ARPES, spin-ARPES, STM, XPS e-
MaxPEEM SPELEEM4, μ-XPS, μ-XAS, nano-ARPES e- [56]
FlexPES XPS, XAS, PEPICO e-
SPECIES AP-XPS5, RIXS e- [57]
R3–3 GeV storage ring
SoftiMAX STXM, CXDI, Imaging X-ray [58, 59]
VERITAS RIXS e-
HIPPIE AP-XPS5 e- [60]
BioMAX High-throughput MX, MAD, SAD, XRF X-ray [61]
NanoMAX Imaging, μ-XRF,μ-XRD, Tomogr X-ray [62]
CoSAXS SAXS, WAXS, Bio-SAXS, XPCS X-ray [63]
DanMAX XRD,PRD, PDF, TS, μ-XRF,μ-XRD, Tomogr X-ray
BALDER Q-EXAFS,XAS, XRF, XES, XRD X-ray [64]
ForMAX SAXS, WAXS, Imaging, Tomogr X-ray
MicroMAX MX, Serial-MX X-ray
SPF–Short Pulse Facility
FemtoMAX Pump-Probe XRD & XRF X-ray [65]

1Photo Luminescence Spectroscopy

2PhotoElectron Photo-Ion Coincidence Spectroscopy

3Time Of Flight Mass Spectroscopy

4Spectroscopic PhotoElectron Low Energy Electron Microscope

5Ambient Pressure PhotoElectron Spectroscopy