| Crystal data |
| Chemical formula |
C11H15N2O+·C2HO4
−
|
|
M
r
|
280.28 |
| Crystal system, space group |
Monoclinic, P
n
|
| Temperature (K) |
300 |
|
a, b, c (Å) |
5.7044 (4), 9.9485 (7), 11.7687 (7) |
| β (°) |
90.321 (2) |
|
V (Å3) |
667.87 (8) |
|
Z
|
2 |
| Radiation type |
Mo Kα |
| μ (mm−1) |
0.11 |
| Crystal size (mm) |
0.30 × 0.22 × 0.06 |
| |
| Data collection |
| Diffractometer |
Bruker D8 Venture CMOS |
| Absorption correction |
Multi-scan (SADABS; Krause et al., 2015 ▸) |
|
T
min, T
max
|
0.715, 0.745 |
| No. of measured, independent and observed [I > 2σ(I)] reflections |
29160, 2730, 2670 |
|
R
int
|
0.032 |
| (sin θ/λ)max (Å−1) |
0.626 |
| |
| Refinement |
|
R[F
2 > 2σ(F
2)], wR(F
2), S
|
0.030, 0.077, 1.10 |
| No. of reflections |
2730 |
| No. of parameters |
202 |
| No. of restraints |
5 |
| H-atom treatment |
H atoms treated by a mixture of independent and constrained refinement |
| Δρmax, Δρmin (e Å−3) |
0.12, −0.21 |
| Absolute structure |
Flack x determined using 1280 quotients [(I
+)−(I
−)]/[(I
+)+(I
−)] (Parsons et al., 2013 ▸) |
| Absolute structure parameter |
−0.2 (2) |
