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. 2023 Jun 1;9(6):e16838. doi: 10.1016/j.heliyon.2023.e16838

Table 9.

J-V characteristic data with HTM with varying ETL/absorber interface defect density.

Nt (cm−2) (ETM-Abs) PCE (%) FF (%) Jsc (mA/cm2) Voc (V)
1005 25.991 78.943 25.782 1.277
1006 25.991 78.943 25.782 1.277
1007 25.991 78.943 25.782 1.277
1008 25.986 78.939 25.782 1.277
1009 25.947 78.902 25.782 1.276
1010 25.608 78.601 25.782 1.264
1011 24.216 77.922 25.782 1.205
1012 22.451 79.166 25.782 1.100