. 2023 Mar 28;3(3):230–240. doi: 10.1021/acsnanoscienceau.2c00065

Table 2. Fitting Results of TRPL Kinetics at 766 nm by the Biexponential Decay Function^a.

air exposure time

0.2 ± 0.1

1.7 ± 0.1

1.3 ± 0.1

0.2 ± 0.1

1.5 ± 0.1

1.1 ± 0.1

Instrument resolution is 0.1 ns. The uncertainty for both lifetimes is instrument resolution. The uncertainty for average lifetime is calculated based on error propagation.

Table 2. Fitting Results of TRPL Kinetics at 766 nm by the Biexponential Decay Functiona.

Table 2. Fitting Results of TRPL Kinetics at 766 nm by the Biexponential Decay Function^a.