Parameters obtained from fitting relaxation rates obtained from AC susceptibility measurements of [Dy(Dtp)2][Al{OC(CF3)3}4]22 along with those extracted from Waveform or DC decay measurements performed on [Dy(Dtp)2][Al{OC(CF3)3}4] to eqn (10). The resultant fits are shown graphically in Fig. 5 and Fig. S106.
| Parameter | DC decays | Waveform | |
|---|---|---|---|
| τ* | e〈ln[τ]〉 | τ Debye | |
| U eff (K) | 1823(28) | 1842(22) | 1845(20) |
| A(τ0 = 10A s−1) | −12.0(0.16) | −12.10(0.12) | −12.11(0.11) |
| R(C = 10R s−1 K−n) | −6.95(0.42) | −7.34(0.34) | −7.52(0.31) |
| n | 3.56(0.30) | 3.84(0.22) | 3.95(0.20) |
| Q(τQTM = 10Q s−1) | 2.591(0.053) | 2.424(0.045) | 2.413(0.031) |