Figure 6.

Dynamic compression of Bi. (a) Integrated XRD data as a function of time. (b) Selected integrated patterns illustrating the pressure-induced Bi-III/Bi-V structural phase transition. (c) Voltage applied to the piezo actuator and sample pressure as a function of time. In (a), the reflections from Bi-III, which has a host–guest structure, are identified using four Miller indices (hklm) (McMahon et al., 2007 ▸). In (c), P _Bi was determined using the EoS of Bi-V (Degtyareva et al., 2004 ▸) and P _Cu was determined using the EoS of Cu (Dewaele et al., 2004 ▸). The intensity of the Cu (111) reflection was very weak, and so P _Cu was determined from the sum of six consecutive diffraction images.