Figure 4.

Inductively detected electron-spin resonance measurement of dead-layer thickness. (a) Preparation of sample. 40 nm of polystyrene, doped to 40 mM with 4-oxo-TEMPO, was spin-coated on top of a silicon substrate. 12 nm of gold was deposited at a rate of $1\text{Å}{\text{s}}^{-1}$ for the standard deposition treatment and $0.1\text{Å}{\text{s}}^{-1}$ for the slow deposition treatment (“stand. dep.” and “slow dep.”, respectively); for comparison, a film with no metal was prepared (“no film”). The films were dissolved in toluene to produce a solution, $0.6\mu \text{M}$ in 4-oxo-TEMPO, for study by inductively detected electron spin resonance (ESR). Damaged spins resulted in a reduced signal amplitude. (b) Signal and standard errors for the three treatments.