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. Author manuscript; available in PMC: 2024 Jul 10.
Published before final editing as: ACS Nano. 2023 Jan 10:10.1021/acsnano.2c08635. doi: 10.1021/acsnano.2c08635

Figure 8.

Figure 8.

A spatially dependent sample T1, due to tip magnetization fluctuations, partially explains the electron-spin resonance signal’s dependence on tip–sample separation and magnetic field. Cross-sectional plot of sample T1 calculated for (a) the Figure 6(a) experiment at h=48nm (cantilever A, assuming d=5nm and Bsat=0.95T) and (b) the Figure 3(a) experiment at h=32nm (cantilever B, assuming d=5nm and Bsat=1.4T). (c, d) Observed (circles) and calculated (lines) electron-spin resonance signal vs magnetic field. The dotted-line calculation assumes no damage layer. The solid-line calculation assumes hdamage=60nm. The simulation in (d) was divided by a factor of 20 to match the experimental signal.