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. 2023 Jun 28;15(13):2849. doi: 10.3390/polym15132849

Figure 5.

Figure 5

XRD diffraction patterns of PLA0HA and PLA/HA scaffolds in position 5–55° with crystal planes respectively attributed to PLA and HA are indicated (a). Quantitative evaluation of the diffraction peak intensity (211) in percentage as a function of wt.% HA incorporated into the scaffolds (b).