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. 2023 Jul 26;83(7):667. doi: 10.1140/epjc/s10052-023-11632-6

Table 18.

Observed cross sections of the HW process in each STXS bin. The uncertainties in the observed cross sections and their ratio to the SM expectation do not include the theoretical uncertainties on the latter. In cases where the ratio to the SM cross section is measured below zero, an upper limit at 68% confidence level on the observed cross section is reported. All dimensional quantities in STXS bin definitions are measured in GeV

STXS bin σ(HW)/σ(HW)SM σ(HW)[pb] σ(HW)SM [pb]
Z (Zleptons); pTV>150 -0.1-0.9+1.2(stat)±0.1(theo)-0.3+0.4(exp) <0.03 0.139±0.013
Z (Zleptons); pTV<150 3.3-0.9+1.0(stat)±0.1(theo)-0.3+0.4(exp) 0.10±0.03 0.030±0.004
W (Wleptons); pTV>150 3.8-1.3+1.5(stat)±0.1(theo)-0.7+0.8(exp) 0.8-0.3+0.4 0.22±0.02
W (Wleptons); pTV<150 1.6±0.8(stat)±0.1(theo)-0.6+0.7(exp) 0.06±0.04 0.035±0.005
qqH; 60<mjj<120 4.1±2.6(stat)-0.6+0.7(theo)±2.2(exp) 1.5±1.2 0.36±0.01
qqH; pTH>200 1.1-0.6+0.7(stat)±0.1(theo)±0.3(exp) 0.17-0.10+0.11 0.15±0.02
qqH; pTH<200; mjj>700 0.7±0.3(stat)±0.1(theo)±0.2(exp) 0.023-0.010+0.011 0.032±0.004
qqH; pTH<200; 350<mjj<700 0.4-0.7+0.8(stat)±0.2(theo)±0.5(exp) 0.04±0.10 0.11±0.03
gH; pTH>300 -2.1-1.5+1.7(stat)-0.3+0.2(theo)-2.0+1.6(exp) <0.04 0.028±0.009
gH; 200<pTH<300 2.3±0.9(stat)±0.1(theo)±0.6(exp) 0.22±0.10 0.09±0.02
gH; 2j 1.8±0.6(stat)±0.4(theo)±0.4(exp) 1.5±0.7 0.9±0.4
gH; 1j; pTH>60 0.41±0.25(stat)-0.06+0.10(theo)±0.17(exp) 0.5±0.4 1.15±0.16
gH; 1j; pTH<60 1.7±0.3(stat)±0.2(theo)±0.2(exp) 2.6-0.6+0.7 1.5±0.2
gH; 0j 0.74±0.07(stat)±0.04(theo)-0.07+0.08(exp) 4.2-0.6+0.7 5.8±0.3