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. 2023 Jul 13;17:1203956. doi: 10.3389/fnins.2023.1203956

Table 4.

Comparison of the ideal model simulation with on-chip performance.

Setups Naff_active/Naff Additional noise and jitter Success rate (25% pattern appearance rate) Success rate (10% pattern appearance rate)
Ideal Model on-chip Ideal model on-chip
1 256/256 No 90% 96% 82% 90%
2 128/256 No 46% 80% 40% (64%)*
3 256/256 Yes 64% 88% 60% 80%
4 128/256 Yes 8% (26%)* 6% (14%)*