Table 3.
Statistical parameters calculated using CPD maps of the Ti-13Nb-13Zr substrate and for the 1G, 2G, and 3G ONTs; CPDav is the arithmetic average, CPDrms is the root mean square deviation, CPDal is the autocorrelation length, CPDsk is the skewness, and CPDku is the excess kurtosis; VKP is the voltage measured versus Kelvin probe.
| Parameter | Ti-13Nb-13Zr | 1G ONTs | 2G ONTs | 3G ONTs |
|---|---|---|---|---|
| CPDav (mVKP) | −634.2 | −566.5 | −480.4 | −386.7 |
| CPDrms (mVKP) | 17.8 | 19.1 | 23.7 | 24.7 |
| CPDal (µm) | 63.61 | 31.37 | 43.12 | 52.29 |
| CPD sk | −0.20 | 0.06 | −0.15 | 0.07 |
| CPD ku | −0.09 | 0.05 | 0.28 | −0.02 |