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. 2023 Aug 19;14(8):1636. doi: 10.3390/mi14081636

Figure 7.

Figure 7

(a) Electroluminescence spectrum of a SiC diode for different device currents and junction temperatures Reprinted with permission from Ref. [96], 2023, IEEE. (b) Experimental setup for TSOP technique extraction from SiC MOSFET Reprinted with permission from Ref. [105], 2023, IEEE.