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. 2023 Aug 15;13(16):2345. doi: 10.3390/nano13162345

Figure 3.

Figure 3

(a) Schematic diagram of the Zn-doped CuI TFTs on glass substrate. (b) Specific capacitance variation with frequency of the chitosan film (inset: FTO/chitosan/FTO device structure for capacitance measurement). (c) Schematic diagram of the EDL formation. (d) Gate leakage current of chitosan film.