CMOS	Complementary Metal-Oxide Semiconductor
DC	Direct Current
IC	Integrated Circuit
PVT	Process Voltage Temperature
HCI	Hot Carrier Injection
BTI	Bias Temperature Instability
TDDB	Time-Dependent Dielectric Breakdown
EM	Electro-Migration
PA	Power Amplifier
IR	Infra Red
RF	Radio Frequency
MOS	Metal-Oxide Semiconductor
CUT	Circuit Under Test
OTA	Operational Transconductance Amplifier
AC	Alternating Current