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. 2023 Aug 25;13(17):2424. doi: 10.3390/nano13172424

Figure 4.

Figure 4

Views of apparatus: (a) SThM and thermal unit inside the dedicated enclosure to decrease influence of thermal drifts and (b) view of the location of the probe above the SiO2f reference sample. Range of displacement of x, y direction piezoelectric scanners enables to switch from SiO2f reference sample to the studied sample (ZrO2 sample for the picture).