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. 2023 Aug 25;13(17):2424. doi: 10.3390/nano13172424
AFM Atomic Force Microscopy
a. u. arbitrary unit
DC Direct current
GUM Guide to the expression of Uncertainty in Measurement
MCM Monte Carlo Method
MCMC Markov Chain Monte Carlo
PDF Probability Distribution Functions
PMMA poly(methyl methacrylate)
POM-C poly-oxymethylene in copolymer
SEM Scanning Electron Microscopy
SI International System of Units (SI for Système International)
SThM Scanning Thermal Microscopy
TCR Temperature Coefficient Ratio