Figure 1.

Rectangular prism (L = 120 μm × W = 120 μm × H = 5 μm) imaged under a standard bright-field microscope. Although the average exposure power was set to be uniform at 11.5 mW (1.46 TW/cm² peak intensity) across the entire device, significant fading is visible in the top right corner. Furthermore, repeated unexpected lines appear parallel to the x-axis every 3–7 μm even though the laser is scanned in the +y direction. Both errors are especially prominent in devices fabricated near the threshold exposure power.