Fig. 4. Scanning electron microscopy (SEM) images acquired in backscattered electron mode (BSE) displaying cross-sections of FCC particles embedded in polymer, cut open with a focused ion beam. The vertical stripes that appear in some of the images originate from the FIB cutting procedure and are not inherent to the studied particles. (a–d) FCC-cat in PP23k. (a′–d′) Segmented images, polymer depicted in yellow, catalyst in blue. To guarantee a correct segmentation of the pores, certain grey scale values were not allocated to the polymer or the support phase. (e–h) FCC-cat in PP307k. (e′–h′) Segmented images.
