Figure 5.

XRD spectra of Co₂₅Fe₇₅ thin films with varying thicknesses grown on (a,c) MgO and (b,d) MgAl₂O₄ (MAO) [25,27]. Note the Laue oscillations for films grown on MAO, which are indicative of high-quality crystalline growth. Insets in (c,d) are XRD rocking curve measurements; the lower full width at half maxima (FWHM) is indicative of less mosaic spread and a better degree of epitaxy in the case of films grown on MAO. Figure 5a,b reprinted with permission from Ref. [25]. Copyright 2018. AIP Publishing (College Park, MD, USA).