. Author manuscript; available in PMC: 2024 Aug 22.

Published in final edited form as: Proc IEEE Comput Soc Conf Comput Vis Pattern Recognit. 2023 Aug 22;2023:11525–11535. doi: 10.1109/cvpr52729.2023.01109

Table 4.

Ablation study of the Retouch Dataset. Conn stands for connectivity modeling with $L_{bicon}$ . DS stands for dice loss.

Conn		Module		Loss		$D S C$	$D S C_{v}$	$A V D$	$B A C C$
Conn		SDE	IFD	DS	SDL	$D S C$	$D S C_{v}$	$A V D$	$B A C C$
1				√		83.2	65.0	0.025	87.0
2	√			√		85.8	70.3	0.024	87.7
3	√	√		√		86.2	73.7	0.023	87.9
4	√	√	√	√		86.7	75.2	0.023	88.3
5	√	√	√		√	87.7	78.2	0.020	90.5