Figure 4.

Sign reversal of AHE in NCO films. a–b) AHE signals measured at various temperatures in NCO films (t = 40 nm) grown at 325 °C and 375 °C, respectively. c) Temperature dependent ρ_A for various NCO films, where the inset displays σ_A versus σ _xx obtained at 4.3 K with ${\sigma }_{\mathrm{A}}={\rho }_{\mathrm{A}}/({\rho }_{xx}^2+{\rho }_{\mathrm{A}}^2)$.