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. Author manuscript; available in PMC: 2023 Oct 19.
Published in final edited form as: Proc IEEE Inst Electr Electron Eng. 2023 May 23;111(10):1236–1286. doi: 10.1109/JPROC.2023.3273517

Fig. 2.

Fig. 2.

Example images in the ISEE dataset [50]. Images were selected after a thorough test–retest reliability study.