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. 2023 Nov 6;14:1059–1067. doi: 10.3762/bjnano.14.87

Figure 1.

Figure 1

(a) Schematic illustrating the connection diagram of sideband KPFM measuring the piezo/photodiode device under modulated illumination. The top view of the device is shown where the inset represents the cross section of the device stack. (b) Time-dependent topography scan showing height variation under alternating illumination, and (c) corresponding time-dependent CPD under alternating illumination. (d) Temporal behavior of displacement and CPD obtained from averaging multiple linear profiles selected from b and c.