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. 2023 Oct 25;13(21):2822. doi: 10.3390/nano13212822

Figure 4.

Figure 4

(a) SEM image of the single CuxO NW contacted with Cu electrodes; (b) 2-terminal I–V characteristics of the single CuxO NW, at ambient pressure and in vacuum; (c) comparison between the 4-terminal and 2-terminal I–V curves, highlighting the very important influence of the contact resistance on the overall device resistance.