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. 2023 Nov 23;14:7644. doi: 10.1038/s41467-023-43466-x

Fig. 4. Electronic structure analysis of Ru/TiOx.

Fig. 4

a XPS of Ti 2p and Ru 3p for the bare TiO2 and Ru/TiOx. b, c Ru 3d XPS spectra of Ru/TiOx, annealed RuOx/TiO2 and com. RuO2/TiO2 before OER stability test (b) and after OER stability test (c). d Ru K-edge synchrotron-based X-ray absorption near-edge structure (XANES) spectra of Ru/TiOx before and after OER stability test using Ru foil and commercial RuO2 as references. e Fourier-transformed (FT) k3-weighted χ(k)-function of the extended X-ray absorption fine structure (EXAFS) spectra for the Ru K-edge. f Relation between the Ru K-edge absorption energy (E0) and valence states for Ru/TiOx, Ru/TiOx after OER stability test, Ru foil, and RuO2. gj Wavelet transforms for the k3-weighted EXAFS signals of Ru foil (g), RuO2 (h), Ru/TiOx (i) and Ru/TiOx after OER stability test (j).