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. 2023 Nov 27;14:7756. doi: 10.1038/s41467-023-43637-w

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© The Author(s) 2023

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 1 — a Schematic of microcontainer devices. b AFM image of a typical device. Green curve, profile along the membrane’s diameter. The vertical bars on the green curve mark the 150 nm region around the diameter over which such profiles were averaged. Note that δ was typically a few tens of nm so that, for clarity, the vertical scale for the green curve is exaggerated with respect to the well’s micrometer diameter. The sagging inside is due to van der Waals interaction with the sidewalls^{2, 31}. c Changes in δ for GO-sealed microcontainers placed under 1 bar of He for a month (different symbols correspond to 11 different devices). d Similar measurements for 8 GO-sealed microcontainers placed under 3 bar of Xe, Kr, Ar and Ne. The dashed lines in panels c and d show the full-range scatter for the devices coded with the same colors.