| AES |
Auger Electron Spectroscopy |
| APECS |
Auger-photoelectron coincidence spectroscopy |
| AFM |
Atomic Force Microscopy |
| ALD |
Atomic Layer Deposition |
| ARXPS |
Angle-resolved X-ray Photoelectron Spectroscopy |
| A-XRD |
Anomalous (Resonant) X-ray Diffraction |
| A-XRR |
Anomalous (Resonant) X-ray Reflectivity |
| BSE |
Backscattered Electron |
| CDI |
Coherent Diffractive Imaging |
| CBED |
Convergent-beam Electron Diffraction |
| CTR |
Crystal Truncation Rod |
| CVD |
Chemical Vapor Deposition |
| EBSD |
Electron Backscatter Diffraction |
| EDS |
Energy-dispersed Spectroscopy |
| EELS |
Electron Energy Loss Spectroscopy |
| EXAFS |
Extended X-ray Absorption Fine Structures |
| FIB |
Focused Ion Beam |
| GIXRD |
Grazing Incidence X-ray Diffraction |
| GISAXS |
Grazing Incidence Small-angle Scattering |
| GIXRF |
Grazing incidence X-ray Fluorescence |
| HAADF |
High-angle Annular Dark Field |
| HRCTRS |
High-resolution Crystal Truncation Rod Scattering |
| HRTEM |
High-resolution Transmission Electron Microscopy |
| HRXRD |
High-resolution X-ray diffraction |
| LEED |
Low-energy Electron Diffraction |
| MExFM |
Magnetic Exchange Force Microscopy |
| MFM |
Magnetic Force Microscopy |
| MBE |
Molecular Beam Epitaxy |
| ND |
Neutron Diffraction |
| NR |
Neutron Reflectivity |
| PDF |
Pair Correlation Functions |
| PEEM |
Photoemission Electron Microscopy |
| PES |
Photoelectron Spectroscopy |
| PLD |
Pulsed Laser Deposition |
| PMA |
Perpendicular Magnetic Anisotropy |
| RHEED |
Reflection High-energy Electron Diffraction |
| RSM |
Reciprocal Space Map |
| RIXS |
Resonant Inelastic X-ray Scattering |
| R-XSW |
Resonant X-ray Standing Wave |
| R-XRD |
Resonant X-ray Diffraction |
| R-XRR |
Resonant X-ray Reflectivity |
| SEM |
Scanning Electron Microscopy |
| SXES |
Soft X-ray Emission Spectroscopy |
| SPLEEM |
Spin-polarized Low-energy Electron Microscopy |
| SP-PES |
Spin-polarized Photoemission Spectroscopy |
| SP-STM |
Spin-polarized Scanning Tunneling Microscopy |
| STEM |
Scanning Transmission Electron Microscopy |
| TEM |
Transmission Electron Microscopy |
| ToF-SIMS |
Time-of-flight Secondary Ion Mass Spectrometry |
| XAFS |
X-ray Absorption Fine Structure |
| XAS |
X-ray Absorption Spectroscopy |
| XANES |
X-ray Absorption Near Edge Structure |
| XES |
X-ray Emission Spectroscopy |
| XMCD |
X-ray Magnetic Circular Dichroism |
| XPS |
X-ray Photoemission Spectroscopy |
| XRD |
X-ray Diffraction |
| XRF |
X-ray Fluorescence |
| XRR |
X-ray Reflectivity |
| XRS |
X-ray Scattering |
| XSW |
X-ray Standing Waves |
| SW-XAFS |
Standing Waves–X-ray Absorption Fine Structure |
| XTEM |
Cross-sectional Transmission Electron Microscopy |