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. 2023 Nov 30;16(23):7468. doi: 10.3390/ma16237468

Figure 4.

Figure 4

(a) The transition temperature and the transition width as a function of 1/d for NbN films with and without an AlN buffer layer [25]. The upper critical field (right y-axis) and the irreversibility field (left y-axis) as a function of reduced temperature T/TC for NbN films with the NbN thickness of (b) 5 nm and (c) 50 nm. The blue-dashed lines represent the generalized G–L model fitting.